CRC Handbook of Thermoelectrics
By
* Publisher: CRC
* Number Of Pages: 720
* Publication Date: 1995-07-14
* ISBN / ASIN: 0849301467
$250.29

Book De******************ion:
Thermoelectrics is the science and technology associated with thermoelectric converters, that is, the generation of electrical power by the Seebeck effect and refrigeration by the Peltier effect. Thermoelectric generators are being used in increasing numbers to provide electrical power in medical, military, and deep space applications where combinations of their desirable properties outweigh their relatively high cost and low generating efficiency. In recent years there also has been an increase in the requirement for thermoelectric coolers (Peltier devices) for use in infrared detectors and in optical communications. Information on thermoelectrics is not readily available as it is widely scattered throughout the literature. The Handbook centralizes this information in a convenient format under a single cover. Sixty of the world's foremost authorities on thermoelectrics have contributed to this Handbook. It is comprised of fifty-five chapters, a number of which contain previously unpublished material. The *******s are arranged in eight sections: general principles and theoretical considerations, material preparation, measurement of thermoelectric properties, thermoelectric materials, thermoelectric generation, generator applications, thermoelectric refrigeration, and applications of thermoelectric cooling. The CRC Handbook of Thermoelectrics has a broad-based scope. It will interest researchers, technologists, and manufacturers, as well as students and the well-informed, non-specialist reader

Format: Per chapter PDFs
Archive: RAR
Size: 65.37 MB

Handbook of Silicon Semiconductor Metrology
By
* Publisher: CRC
* Number Of Pages: 896
* Publication Date: 2001-06-29
* ISBN / ASIN: 0824705068
$204.66

Book De******************ion:
Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay, acoustic film thickness, dopant dose, junction depth, and electrical measurements; particle and defect detection; and flatness following chemical mechanical polishing. Providing examples of well-developed metrology capability, the book focuses on metrology for lithography, transistor, capacitor, and on-chip interconnect process technologies